Ferrara, Mike: search on Z-Library

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1

[IEEE IEEE GLOBECOM 2008 - 2008 IEEE Global Telecommunications Conference - New Orleans, LA, USA (2008.11.30-2008.12.4)] IEEE GLOBECOM 2008 - 2008 IEEE Global Telecommunications Conference - A Domination Approach to Clustering Nodes for Data Aggregation

Mamidisetty, Kranthi K., Ghamande, Maithili, Ferrara, Mike, Sastry, Shivakumar

Year:

2008

Language:

english

File:

PDF, 188 KB

english, 2008

2

Development of Multi-Actuated Ground Vehicles: Educational aspects

Ivanov, Valentin, Augsburg, Klaus, Blundell, Mike, Nijs, Wouter De, Desmet, Wim, Ferrara, Antonella, Kanarachos, Stratis, Kiele-Dunsche, Mathias, Klomp, Matthijs, Metzner, Steffen, Naets, Frank, Nedom

Journal:

IFAC-PapersOnLine

Year:

2018

Language:

english

File:

PDF, 801 KB

english, 2018

3

Plyometrics in Rehabilitation of the Upper Extremity

Courson, Ron, Dillon, Mike, Hicks, Terri, Navitskis, Lenny, Ferrara, Mike

Journal:

Athletic Therapy Today

Year:

1999

Language:

english

File:

PDF, 5.57 MB

english, 1999

4

Irregularity strength of digraphs

Mike Ferrara, Jesse Gilbert, Mike Jacobson, Thor Whalen

Journal:

Discrete Mathematics

Year:

2009

Language:

english

File:

PDF, 583 KB

english, 2009

5

Effort Thrombosis in a College Football Quarterback

Courson, Ron, Elliott, Ron, Dillon, Mike, Mulherin, Butch, Ferrara, Mike, Robinson, Mixon, Tanner, Jeff

Journal:

Athletic Therapy Today

Year:

1999

Language:

english

File:

PDF, 4.34 MB

english, 1999

6

Corrigendum: Corrigendum to Development of Multi-Actuated Ground Vehicles: Educational aspects IFAC-PapersOnline Volume 51, Issue 9, 2018, Pages 236-242

Ivanov, Valentin, Augsburg, Klaus, Blundell, Mike, DeNijs, Wouter, Desmet, Wim, Ferrara, Antonella, Kanarachos, Stratis, Kiele-Dunsche, Mathias, Klomp, Matthijs, Metzner, Steffen, Naets, Frank, Nedoma

Journal:

IFAC-PapersOnLine

Year:

2018

File:

PDF, 508 KB

2018

7

[IEEE [Reliability of Compound Semiconductors] ROCS Workshop 2006 - San Antonio, TX, USA (2006.11.12-2006.11.12)] [Reliability of Compound Semiconductors] ROCS Workshop 2006 - Analysis of Lead Free Tin Whisker Test Methodology and Characterization

Cui, Helen, Ferrara, Mike, Mlcak, Matthew

Year:

2006

Language:

english

File:

PDF, 8.46 MB

english, 2006

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